RayDex. Our brandnew sensor group optical stylus, for example,
for highly accurate interior evaluation, is not yet online.
For more information please send a product request at "contact".
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StraDex™ and RayDex sensors for the first time permit layer thickness evaluations and topographical measurements at sub-micrometer precision with acquisition rates of several kHz during the in-line production process
Layer thickness evaluation:
a) multi-layered foils and coatings (both may be opaque) and
b) semiconductor wafers (after the polishing process) as well as
c) micromechnical components (MEMS).
Topography evaluation:
a) Exterior surfaces as well as even very small interior spaces of high-precision components in automotive or microsystems applications. In addition, the software is able to perfom comparisons of measured and nominal data, evaluate roughness, and detect micro-defects.
All StraDex sensors are based on our patented SCI („Spectral Coherence Interferometry“) technology.
